SUMMARY: Master Degreed Electrical Engineer with a solid practical and theoretical background acquired through the optical and electrical stressed EYE test equipment business as well as design and support of automated systems used in the manufacture and testing of wavelength adjustable semiconductor lasers, DFB lasers, Optical Receivers (PIN and APD), GaAs devices as well as submarine cable opto-electronic components and subsystems.

SKILLS: System Integration, RF design, Analog design, Automation of Instrumentation: RF measurements S-parameters, BER and O-scope etc. Linux/IEEE-488(GPIB), Java Applications, C#, .NET, Visual Basic6/IEEE-488, HP's Rocky Mt. Basic, XML, HTML, and some UNIX system admin.

EMPLOYMENT HISTORY:

Circadiant Systems/ JDSU December 2005 – Present

Position Held: Senior Development Engineer- Developed new products including the Hydra LRM

Agility Communications January 2004 – December 2005.

Position Held: Senior Development/Project Engineer - recommissioning automated systems.

T-Networks August 2003 - January 2004.

Position Held: Senior Test Engineer – RF Test, Automated fiber alignment system. Greatly increased test capacity. Employee of the month for 12/2003.

Consulting Engineer December 2002 - December 2006.

Customers include JDSU, Agility Communications, and Matrix Instruments.

Agility Communications August 2000 - December 2002.

Position Held: Senior Development Engineer - lead team of developers in PA.

Lucent Technologies (formerly AT&T) 1982 - August 2000.

Position Held: Member of Technical Staff.

EXPERIENCE:

Test Instruments: Design and automate test, calibration and verification strategies for electrical and optical test instruments. Write software applications for use in the testing & calibration of the product. Participate in design reviews to assure product is easy to manufacture, verify and calibrate. This position requires a broad base of RF, analog circuits and optics knowledge, to assure SFF-8431 and IEEE 802.3aq compliant stressed signals are repeatably generated. This product produces 10Gb/s signals that have very defined amounts of ISI and signal to noise. I've been responsible for designing creative verification methods, automating those methods, and training technicians to utilize that automation in a manufacturing environment. I also provide feedback on the hardware design and suggest design improvements that both increase yields and lower cost.

Tunable Lasers: Designed Visual Basic 6 applications using a three tiered modular software architecture to run automated test equipment. This ISO 9000 compliant modular method allowed for three developers to work on automating measurements simultaneously while maximizing the re-use of fully debugged code. This software replaced the non-modular non-reusable code in service at the start of my employment with Agility, and is still in production use. Reworked hardware and software of preexisting laser burn in systems to increase equipment reliability to allow production ramp to increase 400% in 12 months.

Passive Optical Parts: Developed measurement method to curve fit data taken during preexisting measurements to an ideal device equation. With the curve fitting done in parallel, this reduced the test time by a factor of 10. In this case, the ideal equation was a very good representation of the part.

Limiting Amplifiers (2.5 & 10 Gb/s): Designed an automated test system that doubled the throughput and cost 70% of the original. The throughput was achieved by making the test program multi-threaded and adding switching to utilize the RF measurement equipment while the other socket was temperature soaking. Capital reduction resulted from redesigning the RF signal source to a more specialized one for this measurement. This project used HP's "Rocky Mountain" Basic running under UNIX.

Transimpedance Amplifiers: Designed automated system to test Transimpedance Amplifiers both on wafer and in packages. The measurement was made with the Agilent 8510 Network Analyzer. Package fixture was designed to preserve the match into the package, and de-embed the S parameters of the DUT from the fixture. The measurement range was 50MHz to 18 GHz.

Failure Mode Analysis:

GaAs Chips: Performed failure mode analysis (FMA) of GaAs ICs for reliability studies, and customer returns. This often involved developing measurement methods and techniques specific for the situation.

Submarine Cable Circuit Packs: Performed FMA and repair of circuit packs at bit rates up to 5Gb/s. Identification of root causes showed a benefit to redesigning the circuit board using different design rules.

Design Experience: Familiar with analog, digital, and RF design. These designs include feedback control circuits using op-amps to control laser diodes at constant light or constant current, temperature measurement and control circuits, combinational and sequential digital circuits to facilitate computer acquisition of test data, and high speed ECLIPS logic circuits to rapidly acquire Bit Error Rate data.

Software: Microsoft Visual Basic 6 using the National Instruments IEEE-488 interface, C#, VisualStudio.NET, Linux with IEEE488, Java, Borland's Jbuilder, NETBeans, HP's "Rocky Mountain" BASIC running under HP UNIX. Additional experience includes H.P. Eesof, LabVIEW, Other software experience includes AutoCAD, MSProject, and Msoffice.

Management Experience: Have functioned as technical lead, giving direction to other engineers and technicians. Also served both as a member and as chairman on the local Township board of Supervisors, and also as member and chair of the Regional Police Commission. The organizations had $2.4M and $1.6M annual budgets respectively. I was intimately involved in negotiating collective bargaining agreements for both the police and the township. Familiar with FSLA and other labor issues.

EDUCATION:

• University of Massachusetts, Amherst, MA Graduate Course in Microwave Engineering.

• Lehigh University, Bethlehem, PA Master of Science in Electrical Engineering. Course work includes experience in electron microscopy. Thesis Topic: A SEMICONDUCTOR LASER DIODE PULSE TESTING SYSTEM.

• Lafayette College, Easton, PA Bachelor of Science in Electrical Engineering Summa Cum Laude.

PROFESSIONAL: TAU BETA PI and ETA KAPPA NU Association, Registered Professional Engineer (Pennsylvania), Pennsylvania Society of Professional Engineers.

PUBLICATIONS: Physical Review B Jan. 82, Vol. 25 p. 389, "Dynamics Of Phase Separation In Two-Dimensional Tricritical Systems," Sahni, Gunton, Katz & Timpe.

Ocean Navigator Jan./Feb. 1995, No. 65 p. 68, "Imposing Corrections: Examining The Coast Guard's Differential GPS Broadcasts," Roy Timpe.

Ocean Voyager 1995, No. 67 p. 70,"Solar Options: More Efficient Panels On The Way?" Roy Timpe.

Conference Proceedings IPC 2nd International Conference on Optoelectronics, June 2002, "Integrated Architecture for Optoelectronics Testing," Rao, Doran, Timpe, et. al. Presented by Roy Timpe June 13, 2002 San Francisco, CA. This paper explains a method of using XML messages to have testing facilities working in concert with the other business systems.

Evaluation Engineering June 2003, p. 18, "GPIB Control With Java On Linux or Windows" Roy Timpe.

PATENTS: Self-optimizing adjustment algorithm. Lucent Technologies (U.S. Pat. Num. 6,449,577)